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Experts
- Josef Kittler
- Arye Nehorai
- John Illingworth
- Mark B. Sandler
- Nahum Kiryati
- Hiroyasu Koshimizu
- Amine Bermak
- Isaac Weiss
- Zhanyi Hu
- Mauro Carlo Beltrametti
- Corrado Di Natale
- Mark S. Nixon
- Mohammed Atiquzzaman
- Anna Maria Massone
- Roberto Paolesse
- Azriel Rosenfeld
- Dmitry P. Nikolaev
- Alfred M. Bruckstein
- Alexandro Catini
- Kazuhito Murakami
- John N. Carter
- Shiu Yin Yuen
- Munetoshi Numada
- Atsushi Imiya
- Raymond K. K. Yip
- Chong Meng Samson See
- Luciano da Fontoura Costa
- Nikos Papamarkos
- Emilio L. Zapata
- Aparecido Nilceu Marana
- Phil L. Palmer
- Taylan O. Gulum
- Songde Ma
- Alex B. Gershman
- Nicolás Guil
- Maria Petrou
- Thambipillai Srikanthan
- Dimitrios Ioannou
- Ebrahim Ghafar-Zadeh
Venues
- Sensors
- ICASSP
- Pattern Recognit. Lett.
- CoRR
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Signal Process.
- IEEE Access
- ISCAS
- ICPR
- Image Vis. Comput.
- Signal Process.
- EUSIPCO
- IEEE SENSORS
- SAM
- ICIP
- ISOEN
- ICASSP (4)
- MVA
- ROBIO
- BioCAS
- Comput. Vis. Image Underst.
- EMBC
- IROS
- IEEE Trans. Image Process.
- BMVC
- Digit. Signal Process.
- I2MTC
- Real Time Imaging
- ICPR (2)
- Systems and Computers in Japan
- IEEE Trans. Biomed. Circuits Syst.
- SIU
- IEEE Signal Process. Lett.
- Mach. Vis. Appl.
- J. Sensors
- ICDAR
- ICCV
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