LINE DETECTION
Experts
- Josef Kittler
- Csaba D. Tóth
- Fabrizio Frati
- Azriel Rosenfeld
- Mauro Carlo Beltrametti
- John Illingworth
- Dmitry P. Nikolaev
- Mark B. Sandler
- Hiroyasu Koshimizu
- Zhanyi Hu
- Anna Maria Massone
- Micha Sharir
- Mark S. Nixon
- Kazuhito Murakami
- Giuseppe Liotta
- Nahum Kiryati
- Erich Kaltofen
- Rafael Grompone von Gioi
- Touqeer Ahmad
- Diane L. Souvaine
- Hugo A. Akitaya
- Olivier D. Faugeras
- George Bebis
- Arnold W. M. Smeulders
- Leonidas J. Guibas
- Emilio L. Zapata
- Kuo-Liang Chung
- Matias Korman
- Kunihito Kato
- Luc Van Gool
- Xianbin Cao
- Nicolás Guil
- Stefan Felsner
- Bok-Suk Shin
- John N. Carter
- Luciano da Fontoura Costa
- Md. Saidur Rahman
- Songde Ma
- Olivier Devillers
Venues
- CoRR
- Pattern Recognit. Lett.
- Pattern Recognit.
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICASSP
- ICPR
- Image Vis. Comput.
- IEEE Access
- ICIP
- IEEE Trans. Instrum. Meas.
- ICDAR
- CVPR
- Mach. Vis. Appl.
- Discret. Math.
- IGARSS
- CCCG
- Remote. Sens.
- Comput. Geom.
- Comput. Vis. Image Underst.
- Inf. Process. Lett.
- Discret. Comput. Geom.
- BMVC
- IEEE Trans. Image Process.
- Comput. Vis. Graph. Image Process.
- MVA
- Graph Drawing
- IEEE Geosci. Remote. Sens. Lett.
- Multim. Tools Appl.
- ICRA
- IROS
- Systems and Computers in Japan
- IEEE Trans. Ind. Electron.
- EUSIPCO
- Comput. Graph.
- ICPR (2)
- Int. J. Pattern Recognit. Artif. Intell.
- ICMV
- ICPR (1)
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend