LEADING EDGE
Experts
- Vahid Garousi
- Michael Felderer
- Jason L. Frand
- Nikolay Harutyunyan
- Gary B. Fogel
- Per Runeson
- Kadir Herkiloglu
- Jorge A. Pérez
- Julia A. Britt
- Laurie P. Dringus
- Rudolf Ramler
- Dirk Riehle
- Andrew Sears
- Edmond Bianco
- Brian Kingsbury
- Yen-Shin Lai
- Dietmar Pfahl
- Marley M. B. R. Vellasco
- Emelie Engström
- William Kent
- Sergio Rico
- Steve Counsell
- Stefan Biffl
- Loet Leydesdorff
- Brian O'Neill
- Eric Guiffo Kaigom
- Juan Manuel Corchado Rodríguez
- Sergio Terzi
- Chia-An Yeh
- George Saon
- Bernadette Bouchon-Meunier
- Lidia Mangu
- Jeffrey R. Yost
- Ronnie Edson de Souza Santos
- Elif Tekes
- Miroslaw Staron
- Jacob Eisenstein
- Elizabeth Bjarnason
- Michael Eichberg
Venues
- CoRR
- IEEE Technol. Soc. Mag.
- Commun. ACM
- Scientometrics
- HICSS
- IEEE Softw.
- AMCIS
- Computer
- IEEM
- IEEE Comput. Intell. Mag.
- CSEE&T
- IEEE Ann. Hist. Comput.
- FAST
- SIGCOMM
- Sensors
- SIGCSE
- IEEE Des. Test Comput.
- FIE
- ECIS
- IBM Syst. J.
- Manag. Sci.
- CBI (1)
- IBM J. Res. Dev.
- IEEE Robotics Autom. Mag.
- ITC
- Interfaces
- AMIA
- Technol. Anal. Strateg. Manag.
- Ind. Manag. Data Syst.
- ICE/ITMC
- ICIS
- ACM SIGSOFT Softw. Eng. Notes
- J. Inf. Syst. Educ.
- IEEE Consumer Electron. Mag.
- PRO-VE
- Int. J. Prod. Res.
- Comput. Ind.
- XRDS
- Int. J. Inf. Manag.
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