LEADING EDGE
Experts
- Michael Felderer
- Vahid Garousi
- Jason L. Frand
- Nikolay Harutyunyan
- Andrew Sears
- Dirk Riehle
- Gary B. Fogel
- Rudolf Ramler
- Kadir Herkiloglu
- Jorge A. Pérez
- Edmond Bianco
- Julia A. Britt
- Laurie P. Dringus
- Per Runeson
- Dietmar Pfahl
- Brian Kingsbury
- Sergio Rico
- Brian O'Neill
- Steve Counsell
- Loet Leydesdorff
- George Saon
- Eric Guiffo Kaigom
- Emelie Engström
- Juan Manuel Corchado Rodríguez
- Sergio Terzi
- Marley M. B. R. Vellasco
- Stefan Biffl
- Chia-An Yeh
- Yen-Shin Lai
- Bernadette Bouchon-Meunier
- William Kent
- Dietmar Winkler
- Margi Sheth
- Thomas Strach
- Ofer Geva
- Philip J. Guo
- Petr Novák
- Tieyong Zeng
- Jakob Mökander
Venues
- CoRR
- IEEE Technol. Soc. Mag.
- Commun. ACM
- Scientometrics
- HICSS
- IEEE Softw.
- Computer
- AMCIS
- IEEM
- IEEE Ann. Hist. Comput.
- IEEE Comput. Intell. Mag.
- CSEE&T
- FAST
- SIGCOMM
- Sensors
- IEEE Des. Test Comput.
- SIGCSE
- IBM Syst. J.
- ECIS
- FIE
- IEEE Robotics Autom. Mag.
- Manag. Sci.
- CBI (1)
- IBM J. Res. Dev.
- Interfaces
- ITC
- ICIS
- ICE/ITMC
- J. Inf. Syst. Educ.
- AMIA
- ACM SIGSOFT Softw. Eng. Notes
- Technol. Anal. Strateg. Manag.
- Ind. Manag. Data Syst.
- IEEE Consumer Electron. Mag.
- PRO-VE
- Learn. Publ.
- TAAI
- CASCON
- IEEE Access
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