LABELING PROCESS
Experts
- Martin Nöllenburg
- Alexander Wolff
- Benjamin Niedermann
- Ignaz Rutter
- Chun-Cheng Lin
- Michael A. Bekos
- Tiziana Calamoneri
- Hsiang-Yun Wu
- Alan L. Yuille
- Antonios Symvonis
- Michael E. Saks
- Binhai Zhu
- Jan Bulánek
- Michael Kaufmann
- Michal Koucký
- Andreas Gemsa
- Junzhou Huang
- Yimin Dou
- Tongliang Liu
- Lukas Barth
- Hsu-Chun Yen
- Ladislav Cmolík
- Jose Dolz
- Martin Baca
- Zhongping Qin
- Rossella Petreschi
- Purushottam Kar
- Sumeet Agarwal
- P. Jeyanthi
- Manik Varma
- Yi Zhang
- Jianbing Zhu
- Kewen Li
- Robert J. Renka
- Yu-Chang Liang
- Vijay Kumar
- Yi Zhang
- Martin Babka
- Achraf Ben-Hamadou
Venues
- CoRR
- AAAI
- Ars Comb.
- CVPR
- Discret. Appl. Math.
- Discret. Math.
- Electron. Notes Discret. Math.
- IEEE Access
- ICPR
- ISBI
- INTERSPEECH
- AKCE Int. J. Graphs Comb.
- Inf. Sci.
- IEEE Trans. Vis. Comput. Graph.
- Multim. Tools Appl.
- CogSci
- Neurocomputing
- ISMIR
- ICDM
- ICASSP
- ACM Trans. Math. Softw.
- IEEE Trans. Image Process.
- ICCV
- BMVC
- ACL (1)
- IEEE Trans. Geosci. Remote. Sens.
- IJCAI
- ICML
- Bioinform.
- J. Comb. Optim.
- ICIP
- NeurIPS
- Medical Image Anal.
- BMC Bioinform.
- IV
- Pattern Recognit.
- Comput. Graph. Forum
- EMNLP
- Graph Drawing
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