LABELING PROCESS
Experts
- Martin Nöllenburg
- Benjamin Niedermann
- Alexander Wolff
- Ignaz Rutter
- Tiziana Calamoneri
- Michael A. Bekos
- Chun-Cheng Lin
- Michael E. Saks
- Andreas Gemsa
- Jan Bulánek
- Michael Kaufmann
- Alan L. Yuille
- Michal Koucký
- Hsiang-Yun Wu
- Binhai Zhu
- Antonios Symvonis
- Hsu-Chun Yen
- Martin Baca
- Robert J. Renka
- Ladislav Cmolík
- Zhongping Qin
- Manik Varma
- Sumeet Agarwal
- Purushottam Kar
- Tongliang Liu
- Junzhou Huang
- Lukas Barth
- Kewen Li
- Jianbing Zhu
- Rossella Petreschi
- P. Jeyanthi
- Yi Zhang
- Jose Dolz
- Yimin Dou
- Benjamin C. Lee
- Sabine Cornelsen
- Hong Jeong
- Guihua Wen
- Jiawei Han
Venues
- CoRR
- AAAI
- Ars Comb.
- Discret. Appl. Math.
- Electron. Notes Discret. Math.
- Discret. Math.
- CVPR
- ISBI
- Inf. Sci.
- INTERSPEECH
- IEEE Access
- AKCE Int. J. Graphs Comb.
- ICPR
- IEEE Trans. Vis. Comput. Graph.
- CogSci
- Neurocomputing
- Multim. Tools Appl.
- ICASSP
- IEEE Trans. Image Process.
- ISMIR
- ICDM
- ICCV
- ACM Trans. Math. Softw.
- IJCAI
- Pattern Recognit.
- ICML
- NeurIPS
- J. Comb. Optim.
- Medical Image Anal.
- BMC Bioinform.
- Discuss. Math. Graph Theory
- EMNLP
- ACL (1)
- Graph Drawing
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Geosci. Remote. Sens.
- ICIP
- IV
- Bioinform.
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