HIT OR MISS TRANSFORM
Experts
- Jesús Angulo
- Sébastien Lefèvre
- Luiza de Macedo Mourelle
- Nadia Nedjah
- Yuri Marchetti Tavares
- Santiago Velasco-Forero
- Stefano Mattoccia
- Luigi di Stefano
- Alexandre de Vasconcelos Cardoso
- Daniel Ruiz-Aguilera
- Élodie Puybareau
- K. Raghunath Rao
- Guillaume Tochon
- Federico Tombari
- Erchan Aptoula
- Shai Avidan
- Sidnei Alves de Araújo
- Sebastià Massanet
- Gonzalo Navarro
- Hae Yong Kim
- Noël Richard
- Jezekiel Ben-Arie
- Alexandre Kirszenberg
- Arnau Mir
- Kimmo Fredriksson
- Manuel González Hidalgo
- B. S. Daya Sagar
- Tiejia Jiang
- Nicolae Vizireanu
- Radu Mihnea Udrea
- Edward R. Dougherty
- Duanpo Wu
- Venkatesh Krishnan
- Zhiguang Huo
- Tao Lei
- Olivier Lezoray
- Audrey Ledoux
- Xiangrui Zeng
- Benjamin Perret
Venues
- CoRR
- IEEE Trans. Image Process.
- Sensors
- EUSIPCO
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit. Lett.
- BMVC
- ICIP
- EMBC
- CVPR
- ICPR
- ISMM
- IGARSS
- ICDSC
- ICPR (3)
- ICPR (2)
- Mach. Vis. Appl.
- Int. J. Model. Identif. Control.
- MVA
- Image Vis. Comput.
- IEEE Trans. Geosci. Remote. Sens.
- IEEE J. Sel. Top. Signal Process.
- Comput. Electron. Agric.
- IbPRIA (1)
- Image Processing: Algorithms and Systems
- IEEE Trans. Circuits Syst. II Express Briefs
- J. Robotics Mechatronics
- IIKI
- ICME
- FUSION
- ICCV
- ISBI
- AMDO
- ISCAS
- VISAPP (2)
- LASCAS
- Comput. Biol. Medicine
- IEEE Trans. Medical Imaging
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