GOODNESS OF FIT
Experts
- Simos G. Meintanis
- Arthur Gretton
- Alejandro F. Frangi
- Leandro Pardo
- Olivier Gaudoin
- Wenkai Xu
- Marco Gaboardi
- Shigeru Yamada
- Narayanaswamy Balakrishnan
- M. C. Pardo
- Juan de Lara
- Heishiro Kanagawa
- Xingzhong Xu
- Yanjun Han
- Daniel Rueckert
- Davide Di Ruscio
- Yongbin Zhou
- Junichi Yamagishi
- Domingo Morales
- Ryan M. Rogers
- Ekaterina Chimitova
- Ziteng Sun
- Xiaodong Wang
- Himanshu Tyagi
- Fanggang Wang
- Xin Wang
- Jayadev Acharya
- Tamara Fernandez
- Elena Landaburu
- Shinji Takaki
- Julia A. Schnabel
- Hidetoshi Onodera
- Clément L. Canonne
- Shinji Inoue
- Lawrence M. Leemis
- Paul Marriott
- George Teseleanu
- Martin Gogolla
- Jean-François Quessy
Venues
- CoRR
- Commun. Stat. Simul. Comput.
- Comput. Stat. Data Anal.
- ICML
- Comput. Stat.
- J. Multivar. Anal.
- Kybernetika
- IEEE Trans. Reliab.
- Stat. Comput.
- ICASSP
- WSC
- Technometrics
- Appl. Math. Comput.
- Bioinform.
- AISTATS
- Entropy
- IEEE Access
- IEEE Trans. Inf. Theory
- Sensors
- Neural Comput.
- PIMRC
- ACC
- Stat. Methods Appl.
- IEEE Trans. Veh. Technol.
- MoDELS
- Qual. Reliab. Eng. Int.
- IACR Cryptol. ePrint Arch.
- DAC
- Comput. Math. Appl.
- Environ. Model. Softw.
- PLoS Comput. Biol.
- ICMC
- ASP-DAC
- Microelectron. J.
- DFT
- Pattern Recognit.
- Inf. Sci.
- IEEE Trans. Medical Imaging
- EUSIPCO
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