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Experts
- Miki Haseyama
- Takahiro Ogawa
- Marcin Zalasinski
- Robert Sabourin
- Krzysztof Cpalka
- Stefano Tubaro
- Qi Tian
- Javier Ortega-Garcia
- Zhizhong Han
- Christoph Trattner
- Wen Gao
- Chunhua Shen
- Arnaldo de Albuquerque Araújo
- Alvaro Soto
- Yu-Shen Liu
- Umapada Pal
- Michael Blumenstein
- Ling Guan
- Armand Joulin
- Rainer Lienhart
- A. Aydin Alatan
- Piotr Bojanowski
- Manabu Okawa
- Mathilde Caron
- David Picard
- Julian Fiérrez-Aguilar
- Matthias Zwicker
- Alberto Del Bimbo
- Hitoshi Kiya
- Danilo Croce
- Mehdi Elahi
- Yuma Kinoshita
- Zhanyi Hu
- Xirong Li
- Luc Van Gool
- Mark S. Nixon
- Thomas Martin Lehmann
- Eric Granger
- Mark Oliver Güld
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- IEEE Access
- CVPR
- ICPR
- Pattern Recognit.
- TRECVID
- ICCV
- Sensors
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- Remote. Sens.
- Pattern Recognit. Lett.
- ICDAR
- IEEE Trans. Image Process.
- ICRA
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- J. Electronic Imaging
- Expert Syst. Appl.
- IJCNN
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- Inf. Sci.
- CVPR Workshops
- AAAI
- J. Vis. Commun. Image Represent.
- Signal Image Video Process.
- Int. J. Pattern Recognit. Artif. Intell.
- IROS
- DICTA
- IEEE Trans. Circuits Syst. Video Technol.
- ICME
- Image Vis. Comput.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Mach. Vis. Appl.
- Vis. Comput.
- Comput. Vis. Image Underst.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
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