GLOBAL FEATURES
Experts
- Miki Haseyama
- Takahiro Ogawa
- Marcin Zalasinski
- Robert Sabourin
- Krzysztof Cpalka
- Stefano Tubaro
- Javier Ortega-Garcia
- Qi Tian
- Alvaro Soto
- Michael Blumenstein
- Arnaldo de Albuquerque Araújo
- Yu-Shen Liu
- Wen Gao
- Ling Guan
- Christoph Trattner
- Umapada Pal
- Chunhua Shen
- Zhizhong Han
- David Picard
- A. Aydin Alatan
- Armand Joulin
- Julian Fiérrez-Aguilar
- Piotr Bojanowski
- Manabu Okawa
- Mathilde Caron
- Rainer Lienhart
- Matthias Zwicker
- Marco Tagliasacchi
- Nicu Sebe
- J. M. Hans du Buf
- Maja Pantic
- Mark Oliver Güld
- Xirong Li
- Kensaku Mori
- Vicente Dominguez
- Pål Halvorsen
- Mehdi Elahi
- Zhongzhi Shi
- Thomas Martin Lehmann
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- IEEE Access
- CVPR
- Pattern Recognit.
- ICPR
- ICCV
- TRECVID
- Sensors
- Neurocomputing
- Remote. Sens.
- ICASSP
- Pattern Recognit. Lett.
- ICDAR
- IEEE Trans. Image Process.
- ICRA
- IGARSS
- J. Electronic Imaging
- Expert Syst. Appl.
- ACM Multimedia
- Inf. Sci.
- IJCNN
- CVPR Workshops
- SIBGRAPI
- Signal Image Video Process.
- AAAI
- J. Vis. Commun. Image Represent.
- IROS
- Int. J. Pattern Recognit. Artif. Intell.
- DICTA
- IEEE Trans. Circuits Syst. Video Technol.
- ICME
- IEEE Trans. Pattern Anal. Mach. Intell.
- CLEF (Working Notes)
- Image Vis. Comput.
- BMVC
- SMC
- Comput. Vis. Image Underst.
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