FINE SCALE
Experts
- Hans-Peter Seidel
- Michael Goesele
- Matthias Nießner
- Han Wang
- Zhuo Hui
- Gyeongmin Choe
- Yao Yao
- Minoru Asada
- Aswin C. Sankaranarayanan
- Jan Kautz
- Yoshiaki Shirai
- Evangelos Kalogerakis
- Chunhui Zhao
- Victoria Interrante
- Péter Balázs
- Difan Liu
- Sunghee Kim
- Ioannis G. Kevrekidis
- Gopal Sharma
- Rishabh Goyal
- Leonidas J. Guibas
- Ye Hong
- Haleh Hagh-Shenas
- Qing Xiao
- Christian Theobalt
- Takayuki Nakamura
- Peter J. Giblin
- Steven W. Zucker
- Hong Qin
- Szymon Rusinkiewicz
- Djamchid Ghazanfarpour
- Subhransu Maji
- Dana R. Yoerger
- Won Kyung Do
- Kai-Kwong Hon
- Edilson de Aguiar
- Yi Lin
- Shaolong Cao
- In-So Kweon
Venues
- CoRR
- Remote. Sens.
- CVPR
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Access
- Comput. Graph. Forum
- Sensors
- ACM Trans. Graph.
- IGARSS
- Pattern Recognit. Lett.
- IEEE Trans. Vis. Comput. Graph.
- Int. J. Appl. Earth Obs. Geoinformation
- Multiscale Model. Simul.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP
- J. Comput. Phys.
- Comput. Aided Des.
- ICRA
- IEEE Trans. Instrum. Meas.
- Vis. Comput.
- Image Vis. Comput.
- IROS
- ICASSP
- Int. J. Comput. Vis.
- IEEE Geosci. Remote. Sens. Lett.
- IJCNN
- Comput. Graph.
- Comput. Vis. Image Underst.
- Expert Syst. Appl.
- PLoS Comput. Biol.
- J. Math. Imaging Vis.
- Trans. GIS
- ICPR
- Ecol. Informatics
- ICCV
- VMV
- Entropy
- ISCAS
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