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Experts
- Alexey Radul
- Oleksiy B. Pogrebnyak
- Ramon Izquierdo-Cordova
- John P. Oakley
- Justin Varghese
- Decai Chen
- Shuai Li
- Giovanni Ramponi
- Yueshan Lin
- Ning Ge
- Yue Gao
- Oliver Schreer
- Mamoru Ugajin
- Feng Lian
- Hong Qin
- Walterio W. Mayol-Cuevas
- Volodymyr I. Ponomaryov
- Ingo Feldmann
- Zhiyong Feng
- Yunfei Chen
- Aimin Hao
- Qing Xia
- Wei Feng
- Adam Paszke
- Peng Zhang
- Peter Eisert
- Chengju Chen
- Subash Saudia
- Kai-Kuang Ma
- Yiru Lian
- Liming Hou
- Richard T. Shann
- Dougal Maclaurin
- Jongwoo Lee
- Hongjian Zuo
- Baiyun Chen
- Yoo-Joo Choi
- Lihong Zhu
- Xianyu He
Venues
- CoRR
- ICIP
- ICASSP
- Sensors
- IGARSS
- Remote. Sens.
- SIAM J. Imaging Sci.
- Pattern Recognit.
- ISCAS
- EUSIPCO
- IEICE Trans. Inf. Syst.
- IEEE Trans. Signal Process.
- Signal Process.
- IEEE Signal Process. Lett.
- OFC
- J. Digit. Imaging
- AAAI
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEEE Trans. Consumer Electron.
- IEEE Trans. Geosci. Remote. Sens.
- ISCAS (4)
- Pattern Recognit. Lett.
- IET Image Process.
- APSIPA
- Vis. Comput.
- Comput. Graph.
- ICIA
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- BioCAS
- INTERSPEECH
- ASICON
- Multim. Tools Appl.
- IEEE Access
- CDC
- FPL
- ICECS
- IEICE Electron. Express
- FUSION
- ICCV
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