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Experts
- Zhiyong Feng
- Shuai Li
- Chengju Chen
- Hong Qin
- Peng Zhang
- Alexey Radul
- Liming Hou
- Volodymyr I. Ponomaryov
- Oliver Schreer
- Ning Ge
- Yiru Lian
- John P. Oakley
- Qing Xia
- Justin Varghese
- Richard T. Shann
- Walterio W. Mayol-Cuevas
- Aimin Hao
- Ingo Feldmann
- Wei Feng
- Oleksiy B. Pogrebnyak
- Giovanni Ramponi
- Subash Saudia
- Yunfei Chen
- Yue Gao
- Kai-Kuang Ma
- Peter Eisert
- Adam Paszke
- Mamoru Ugajin
- Decai Chen
- Dougal Maclaurin
- Feng Lian
- Yueshan Lin
- Ramon Izquierdo-Cordova
- Yuh-Yuan Wang
- Ying Zhang
- Keith Morgan
- Takuya Shindou
- John Walsh
- Dongdong Ding
Venues
- CoRR
- ICIP
- ICASSP
- Sensors
- IGARSS
- IEICE Trans. Inf. Syst.
- IEEE Trans. Signal Process.
- Remote. Sens.
- Pattern Recognit.
- ISCAS
- EUSIPCO
- Signal Process.
- SIAM J. Imaging Sci.
- ISCAS (4)
- IEEE Access
- IEEE Signal Process. Lett.
- BioCAS
- FPL
- Vis. Comput.
- Multim. Tools Appl.
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEEE Trans. Consumer Electron.
- ICECS
- IEICE Electron. Express
- J. Digit. Imaging
- ICIA
- Comput. Graph.
- AAAI
- ICCV
- FUSION
- CDC
- IET Image Process.
- Pattern Recognit. Lett.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- INTERSPEECH
- APSIPA
- OFC
- ASICON
- IEEE Trans. Geosci. Remote. Sens.
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