FEATURE DETECTORS
Experts
- Shoaib Ehsan
- Klaus D. McDonald-Maier
- Tony Lindeberg
- Jean-Michel Morel
- Naveed ur Rehman
- Bruno Ferrarini
- Adrian F. Clark
- Luc Van Gool
- Theo Gevers
- Sonya A. Coleman
- Madhu Sudan
- Pietro Perona
- Ales Leonardis
- Yannis Avrithis
- Bryan W. Scotney
- Arnab Bhattacharyya
- Guojun Lu
- Stefanos D. Kollias
- Mariano Rodríguez
- Konstantinos Rapantzikos
- Louis L. Scharf
- Esa Rahtu
- Julie Delon
- Jiwu Huang
- Ryotaro Kamimura
- Michael Unser
- Gauthier Lafruit
- Gabriele Facciolo
- Ivan Sipiran
- Krystian Mikolajczyk
- Nicholas R. Gans
- Vjacheslav A. Yurko
- João Batista Florindo
- Timothy F. Cootes
- Josef Kittler
- Jianwei Zhang
- Michael Brady
- Marek Kraft
- Joost van de Weijer
Venues
- CoRR
- ICIP
- Sensors
- CVPR
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICPR
- IEEE Access
- Pattern Recognit.
- Multim. Tools Appl.
- ICCV
- IGARSS
- ICASSP
- IEEE Trans. Image Process.
- BMVC
- Int. J. Comput. Vis.
- ICRA
- IROS
- DICTA
- IEEE Trans. Instrum. Meas.
- Image Vis. Comput.
- Remote. Sens.
- CVPR Workshops
- Neurocomputing
- J. Math. Imaging Vis.
- EUSIPCO
- Appl. Math. Comput.
- EMBC
- ISSAC
- IEEE Trans. Geosci. Remote. Sens.
- MVA
- Symmetry
- Comput. Electron. Agric.
- Signal Process.
- J. Electronic Imaging
- Appl. Math. Lett.
- ISCAS
- ICIP (1)
- WACV
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