FALSE DETECTION RATE
Experts
- Marcel Medwed
- Emanuele Grossi
- Marco Lops
- Luca Venturino
- Chun Chen
- Jingpei Wang
- Anton H. M. Akkermans
- Stefan Kleszczynski
- Susan M. Astley
- J. M. Kim
- Rong-Chang Chen
- Andreas C. Neocleous
- Chiranjeev Kumar
- Jianping He
- Pascal Memmesheimer
- R. S. Bhatia
- Kieran McLaughlin
- Vincent Heuveline
- Jun-Horng Chen
- Kyukwang Kim
- Jan Achterhold
- Jean Philippe Ovarlez
- Hadi Veisi
- D. K. Jain
- I-Lin Tang
- Simon Hoermann
- Daniel H. Stolfi
- Raymond N. J. Veldhuis
- Pamela Mancuso
- Upamanyu Madhow
- Christos N. Schizas
- Wenzhe Zheng
- Thinagaran Perumal
- Frédéric Pascal
- Xu-Yao Zhang
- Tung-Shou Chen
- Michael Biehl
- Md Nasir Sulaiman
- Nicky B. Barr
Venues
- CoRR
- IEEE Access
- Softw. Test. Verification Reliab.
- ICIT
- UIST
- Digital Mammography / IWDM
- AISI
- CogSci
- IEEE Trans. Smart Grid
- Soft Comput.
- J. Digit. Imaging
- ICSPCC
- IEEE Trans. Commun.
- IJCNN
- Sensors
- SIU
- IPDPS Workshops
- IACR Cryptol. ePrint Arch.
- Frontiers Inf. Technol. Electron. Eng.
- Eng. Appl. Artif. Intell.
- Trans. Emerg. Telecommun. Technol.
- J. Comput. Appl. Math.
- Int. J. Parallel Emergent Distributed Syst.
- NeuroImage
- WACV
- ICTCC
- SAC
- EURASIP J. Adv. Signal Process.
- GIL Jahrestagung
- ICCCV
- FDTC
- IET Softw.
- Int. J. Pattern Recognit. Artif. Intell.
- ISBI
- Comput. Phys. Commun.
- SEUS
- Medical Biol. Eng. Comput.
- NBiS
- IEEE Trans. Aerosp. Electron. Syst.
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