FALSE DETECTION RATE
Experts
- Marco Lops
- Emanuele Grossi
- Luca Venturino
- Marcel Medwed
- Yongyan Jiang
- Mustafa A. Altinkaya
- Jean Philippe Ovarlez
- Gi Soon Cha
- Chun Chen
- Philip O'Kane
- Jingpei Wang
- Adeel Razi
- Hossein Sameti
- Norwati Mustapha
- Tung-Shou Chen
- Manuel S. Stein
- Giovanna Sannino
- Cinzia Campari
- Christoph W. Borst
- Kwang Nam Choi
- Anton H. M. Akkermans
- Fumihiko Taya
- Yuchan Wang
- Cheng-Lin Liu
- Pawel Andrzej Herman
- Houssam Halmaoui
- Robert W. Lindeman
- Chongrong Fang
- Fei Zhu
- Marc Hanheide
- António dos Anjos
- Shuihua Wang
- Vincent Heuveline
- Ahmed Ghoneim
- Rita Vacondio
- Caroline R. M. Boggis
- Daniel H. Stolfi
- Chunbo Chu
- Ehtesham Iqbal
Venues
- CoRR
- IEEE Access
- IEEE Trans. Aerosp. Electron. Syst.
- IEEE Trans. Inf. Theory
- Trans. Emerg. Telecommun. Technol.
- WACV
- Digital Mammography / IWDM
- ISBI
- IEEE Trans. Commun.
- IEEE Trans. Smart Grid
- EICC
- IET Softw.
- Frontiers Inf. Technol. Electron. Eng.
- Neural Process. Lett.
- AISI
- ICIT
- Sensors
- NeuroImage
- IET Signal Process.
- J. Digit. Imaging
- SIU
- UIST
- FDTC
- ICCCV
- GCCE
- TrustCom/BigDataSE/ISPA (2)
- Softw. Test. Verification Reliab.
- J. Comput. Appl. Math.
- IJCNN
- CogSci
- IEEE Signal Process. Lett.
- Comput. Phys. Commun.
- SAC
- EURASIP J. Adv. Signal Process.
- SEUS
- NBiS
- ICSPCC
- Int. J. Pattern Recognit. Artif. Intell.
- ICASSP
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