FACE MATCHING
Experts
- Mayank Vatsa
- Richa Singh
- Christoph Busch
- Anil K. Jain
- Guodong Guo
- Jean-Luc Dugelay
- Stan Z. Li
- Christian Rathgeb
- Kevin W. Bowyer
- Debotosh Bhattacharjee
- Arun Ross
- Kiran B. Raja
- Patrick J. Flynn
- Ran He
- Shiguang Shan
- P. Jonathon Phillips
- Naser Damer
- Himanshu S. Bhatt
- Iacopo Masi
- Zhen Lei
- Stefanos Zafeiriou
- Sébastien Marcel
- Pavel Král
- Andreas Lanitis
- Mita Nasipuri
- Vitomir Struc
- Christopher J. Taylor
- Timothy F. Cootes
- Raghavendra Ramachandra
- Gérard G. Medioni
- Weihong Deng
- Huy H. Nguyen
- Dong Yi
- Massimo Tistarelli
- Isao Echizen
- Ladislav Lenc
- Samarth Bharadwaj
- Florian Kirchbuchner
- Ulrich Scherhag
Venues
- CoRR
- FG
- IEEE Trans. Inf. Forensics Secur.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP
- CVPR Workshops
- Pattern Recognit.
- ICPR
- IEEE Access
- CogSci
- BIOSIG
- IJCB
- Image Vis. Comput.
- BTAS
- ICB
- CVPR
- Pattern Recognit. Lett.
- ICCV
- Multim. Tools Appl.
- NeuroImage
- ICASSP
- J. Cogn. Neurosci.
- FGR
- Neurocomputing
- IET Biom.
- IWBF
- WACV
- SIU
- IEEE Trans. Image Process.
- IJCNN
- BMVC
- RO-MAN
- Expert Syst. Appl.
- INTERSPEECH
- Int. J. Pattern Recognit. Artif. Intell.
- AVBPA
- ICIAP
- Comput. Vis. Image Underst.
- Sensors
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