ELECTRON BEAM LITHOGRAPHY
Experts
- David Z. Pan
- Bei Yu
- Yao-Wen Chang
- Jhih-Rong Gao
- Kun Yuan
- Shao-Yun Fang
- Fumihito Arai
- Andrew J. Fleming
- Omid T. Ghalehbeygi
- Carolin Körner
- Regina Ammer
- Wengang Wu
- Toly Chen
- Matthias Markl
- Roderick R. Kunz
- Ulrich Rüde
- Jungkwun J. K. Kim
- Soo-Young Lee
- Sergey A. Bobkov
- Ioannis Exarchos
- Ben S. Routley
- Jian Kuang
- Yi Yin
- Takahiro Sawa
- Dongxu Ren
- Baohua Chang
- Makoto Sugihara
- Zhimin Zhang
- Otto Zhou
- Vadim Tynchenko
- Thomas Bazin
- Shuhe Chang
- Dominic Windisch
- M. Wörner
- Charles T. Black
- I. Bányász
- Hans C. Pfeiffer
- Christian Daul
- Jianping Lu
Venues
- IBM J. Res. Dev.
- NEMS
- CoRR
- Sensors
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Microelectron. J.
- Microelectron. Reliab.
- IEICE Trans. Electron.
- OFC
- Int. J. Autom. Technol.
- DAC
- ICIP
- Comput. Phys. Commun.
- ICTON
- Micromachines
- ISSCC
- IEEE Access
- ICCAD
- ISCAS
- ISPD
- CICC
- ASP-DAC
- Proc. IEEE
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Ind. Electron.
- ACC
- VLSI Design
- ISQED
- Int. J. Comput. Assist. Radiol. Surg.
- IGARSS
- ICAC
- ISBI
- Int. J. Comput. Eng. Sci.
- Symmetry
- ICECS
- BCICTS
- Computer
- IEEE Trans. Control. Syst. Technol.
- ICMENS
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