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Experts
- Shoji Kawahito
- Konstantinos N. Plataniotis
- Rastislav Lukac
- Masatoshi Okutomi
- Takayuki Hamamoto
- Xiaolin Wu
- Masayuki Tanaka
- Raimondo Schettini
- Ángel Rodríguez-Vázquez
- Ramesh Raskar
- Yusuke Monno
- Jun Ohta
- Jiangtao Xu
- Sabine Süsstrunk
- Moon Gi Kang
- Yeong Min Jang
- Jon Yngve Hardeberg
- Keita Yasutomi
- Amine Bermak
- Kang Ryoung Park
- Toshihiko Noda
- Kaiming Nie
- Ricardo Carmona-Galán
- Kuo-Liang Chung
- Keigo Hirakawa
- Michael S. Brown
- Robert K. Henderson
- Keiichiro Kagawa
- Saraju P. Mohanty
- Kaushik Roy
- Roy S. Berns
- Abhijit Chatterjee
- Oscar C. Au
- Antoine Dupret
- Sharmil Randhawa
- Ralph Etienne-Cummings
- Orly Yadid-Pecht
- Joonki Paik
- Edoardo Charbon
Venues
- Sensors
- CoRR
- ISCAS
- IEEE J. Solid State Circuits
- IEEE Access
- ICIP
- IEEE Trans. Consumer Electron.
- IEEE Trans. Instrum. Meas.
- Remote. Sens.
- ISSCC
- Color Imaging Conference
- IEEE Trans. Image Process.
- Multim. Tools Appl.
- Digital Photography
- EMBC
- ICASSP
- ICECS
- IEEE SENSORS
- ICRA
- IGARSS
- PICS
- J. Electronic Imaging
- IEEE Consumer Electron. Mag.
- IEICE Electron. Express
- IEEE Trans. Circuits Syst. II Express Briefs
- CICC
- ICCE
- CVPR
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IROS
- OFC
- I2MTC
- IEEE Trans. Circuits Syst. Video Technol.
- Microelectron. J.
- ACM Trans. Graph.
- ESSCIRC
- CIC
- EUSIPCO
- CVPR Workshops
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