DIAGNOSTIC EXPERT SYSTEMS
Experts
- Marcus Rohrbach
- Ross B. Girshick
- Dhruv Batra
- Zechen Li
- Justin Johnson
- José M. F. Moura
- Robert Milne
- Laurens van der Maaten
- Li Fei-Fei
- Devi Parikh
- Anders Søgaard
- C. Lawrence Zitnick
- Satwik Kottur
- Seppo Torvinen
- Christian Stary
- Karl Fasching
- Bharath Hariharan
- Andrey Skobelev
- Sriram Narasimhan
- Shantanu Nundy
- Olivier Hû
- Vittorio Rossetti
- Arthur J. Brodersen
- Yannick Aoustin
- Aleksey Kasimov
- Oleh V. Andriichuk
- Doug Foxvog
- Barry B. Flachsbart
- Fernando Caldeira-Saraiva
- Charles E. Solbrig
- Jerome Tonetti
- Antonio Muscari
- Arjan J. C. van Gemund
- Lars Müller
- Yasuo Sato
- Carlo Bach
- Sameer Serhal
- David García
- Ayrat Sitdikov
Venues
- CoRR
- J. Intell. Manuf.
- MIE
- IEA/AIE (Vol. 1)
- IC
- Softw. Pract. Exp.
- ITC
- JFPLC
- IEA/AIE
- ITS
- JFSMA
- Egypt. Comput. Sci. J.
- Microprocess. Microsystems
- Knowl. Based Syst.
- TALN (Demonstrations)
- ICAD
- Artif. Intell. Medicine
- CVPR
- Scientometrics
- Tech. Sci. Informatiques
- Bell Syst. Tech. J.
- AI Commun.
- Artif. Intell. Eng. Des. Anal. Manuf.
- IEA/AIE (Vol. 2)
- ICLS (1)
- NAACL-HLT (1)
- IEEE Expert
- Synth.
- Expert Syst. J. Knowl. Eng.
- ECAI
- RFC
- IHM
- MetroAutomotive
- J. Am. Medical Informatics Assoc.
- Comput. J.
- ICCA
- Expert Syst. Appl.
- DEXA
- IntelliSys (1)
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