AUTOMATED VISUAL INSPECTION
Experts
- Wenming Lin
- Du-Ming Tsai
- Yukino Baba
- Marcos Portabella
- Stefan Biffl
- Hisashi Kashima
- Daniel F. García
- Ad Stoffelen
- Rubén Usamentiaga
- Chuan-Yu Chang
- Xuewu Zhang
- Rosa Rodríguez-Montañés
- Dunja Mladenic
- Haiyong Chen
- Joze M. Rozanec
- Rahul Pandita
- Hong-Dar Lin
- Paulo Leitão
- Stefan Wagner
- Blaz Fortuna
- Ben Glocker
- Joan Figueras
- Chih-Yang Lin
- Hao Zhang
- Daniel Rueckert
- Oscar Castillo
- Jiajun Zhang
- Bostjan Likar
- Xiangning Lu
- Yordan P. Raykov
- Guanglan Liao
- Bastian Wandt
- Jason Watkins
- Dejan Tomazevic
- Max A. Little
- Jürgen Beyerer
- Ajay Kumar
- Yang Zhang
- Francisco G. Bulnes
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Bioinform.
- Expert Syst. Appl.
- Remote. Sens.
- Mach. Vis. Appl.
- IEEE Trans. Ind. Informatics
- J. Electronic Imaging
- ITC
- J. Intell. Manuf.
- Comput. Electron. Agric.
- MVA
- Eng. Appl. Artif. Intell.
- Microelectron. Reliab.
- IROS
- Comput. Ind.
- BMVC
- Image Vis. Comput.
- BMC Bioinform.
- Adv. Eng. Informatics
- ICIP
- Multim. Tools Appl.
- IEEE Trans. Ind. Electron.
- CASE
- I2MTC
- Comput. Ind. Eng.
- J. Digit. Imaging
- ETFA
- Pattern Recognit.
- Eur. J. Oper. Res.
- ICRA
- Real Time Imaging
- NeuroImage
- Technometrics
- Digital Mammography / IWDM
- M2VIP
- Qual. Reliab. Eng. Int.
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