AUTOMATED VISUAL INSPECTION
Experts
- Wenming Lin
- Du-Ming Tsai
- Yukino Baba
- Marcos Portabella
- Stefan Biffl
- Hisashi Kashima
- Ad Stoffelen
- Chuan-Yu Chang
- Daniel F. García
- Rubén Usamentiaga
- Rahul Pandita
- Dunja Mladenic
- Chih-Yang Lin
- Paulo Leitão
- Ben Glocker
- Blaz Fortuna
- Xuewu Zhang
- Joze M. Rozanec
- Haiyong Chen
- Rosa Rodríguez-Montañés
- Joan Figueras
- Stefan Wagner
- Hong-Dar Lin
- Fityanul Akhyar
- Bastian Wandt
- Yiyong Yao
- Biao Jiang
- Jürgen Beyerer
- Patricia Melin
- Alberto Tellaeche
- Jorge L. C. Sanz
- Liping Zhao
- Bodo Rosenhahn
- Guanglan Liao
- Mingyu Gao
- Oscar Castillo
- Hermann Baumgartl
- Wenjia Bai
- Hao Zhang
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Bioinform.
- Remote. Sens.
- Expert Syst. Appl.
- Mach. Vis. Appl.
- IEEE Trans. Ind. Informatics
- J. Electronic Imaging
- ITC
- J. Intell. Manuf.
- MVA
- Comput. Electron. Agric.
- IROS
- Microelectron. Reliab.
- Eng. Appl. Artif. Intell.
- BMVC
- Comput. Ind.
- Image Vis. Comput.
- BMC Bioinform.
- Adv. Eng. Informatics
- IEEE Trans. Ind. Electron.
- ICIP
- Multim. Tools Appl.
- CASE
- I2MTC
- Comput. Ind. Eng.
- ETFA
- J. Digit. Imaging
- ICRA
- Pattern Recognit.
- Real Time Imaging
- Eur. J. Oper. Res.
- Digital Mammography / IWDM
- Qual. Reliab. Eng. Int.
- SMC
- Technometrics
- NeuroImage
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend