An efficient BER-based reliability method for SRAM-based FPGA.
Fouad SahraouiFakhreddine GhaffariMohamed El Amine BenkhelifaBertrand GranadoPublished in: IDT (2013)
Keyphrases
- high accuracy
- segmentation method
- real time
- high precision
- synthetic data
- similarity measure
- data transmission
- estimation algorithm
- support vector machine
- computational cost
- edge detection
- support vector machine svm
- clustering method
- error rate
- experimental evaluation
- significant improvement
- k means
- highly efficient
- computational complexity
- multiscale