Reliable Threshold Voltage Determination for Sub-0.1µm Gate Length MOSFET's.
Morikazu TsunoMasato SugaMasayasu TanakaKentaro ShibaharaMitiko Miura-MattauschMasataka HirosePublished in: ASP-DAC (1998)
Keyphrases
- energy dissipation
- field effect transistors
- power system
- power supply
- silicon dioxide
- cost effective
- low power
- high quality
- threshold selection
- steady state
- fixed length
- transmission line
- thresholding method
- adaptive threshold
- high voltage
- artificial intelligence
- traffic flow
- high density
- threshold values
- high speed
- high resolution
- feature vectors
- operating point
- minimal length