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Soft error study in double gated FinFET-based SRAM cells with simultaneous and independent driven gates.
V. N. Ramakrishnan
R. Srinivasan
Published in:
Microelectron. J. (2012)
Keyphrases
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simulation study
low power
error rate
theoretical framework
data sets
information technology
artificial neural networks
data driven
empirical studies
experimental study