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A model for the critical voltage for electrical degradation of GaN high electron mobility transistors.
Jungwoo Joh
Feng Gao
Tomás Palacios
Jesús A. del Alamo
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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mathematical model
computational model
high level
probabilistic model
statistical model
prior knowledge
experimental data
learning algorithm
similarity measure
x ray
simulation model
formal model