Robust Electromigration reliability through engineering optimization.
Wee Loon NgKheng Chok TeeJunfeng LiuYong Chiang EeOliver AubelChuan Seng TanKin Leong PeyPublished in: Microelectron. Reliab. (2014)
Keyphrases
- optimization process
- optimization method
- data sets
- highly reliable
- robust optimization
- robust estimation
- optimization methods
- global optimization
- optimization algorithm
- artificial intelligence
- software engineering
- multi agent
- face recognition
- engineering design
- constrained optimization
- data mining
- databases
- real time
- optimum design
- simultaneous optimization