Login / Signup
A Comparison of Uncertainty Evaluation Methods for On-Wafer $S$-Parameter Measurements.
Valeria Teppati
Andrea Ferrero
Published in:
IEEE Trans. Instrum. Meas. (2014)
Keyphrases
</>
evaluation methods
evaluation method
evaluation criteria
measurement noise
evaluation methodology
evaluation metrics
measurement errors
page segmentation
neural network
machine learning
user centred evaluation