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Experts
- Chew Lim Tan
- David S. Doermann
- Jean-Marc Ogier
- C. V. Jawahar
- Thomas M. Breuel
- Faisal Shafait
- Basilios Gatos
- Sekhar Mandal
- Rolf Ingold
- Marcus Liwicki
- Apostolos Antonacopoulos
- Bhabatosh Chanda
- Syed Saqib Bukhari
- Mohamed Cheriet
- Gaofeng Meng
- Santanu Chaudhury
- Ioannis Pratikakis
- S. P. Chowdhury
- Rafael Dueire Lins
- Soumyadeep Dey
- Chunhong Pan
- Maroua Mehri
- Yue Lu
- Daniel P. Lopresti
- Koichi Kise
- Reza Farrahi Moghaddam
- Robert M. Haralick
- Shamik Sural
- Ajoy Mondal
- Shiming Xiang
- Nibaran Das
- Pierre Héroux
- Stavros J. Perantonis
- Mickaël Coustaty
- Laurent Heutte
- Najoua Essoukri Ben Amara
- P. Nagabhushan
- Petra Gomez-Krämer
- Andreas Dengel
Venues
- CoRR
- ICDAR
- ICPR
- Int. J. Document Anal. Recognit.
- Pattern Recognit.
- Document Analysis Systems
- DRR
- ICIP
- DAS
- IEEE Trans. Pattern Anal. Mach. Intell.
- Document Recognition
- Pattern Recognit. Lett.
- ICASSP
- IEEE Access
- SAC
- IEEE Trans. Image Process.
- Document Recognition and Retrieval
- CHI
- ICFHR
- ACM Symposium on Document Engineering
- WWW
- Remote. Sens.
- SIAM J. Numer. Anal.
- DocEng
- Int. J. Pattern Recognit. Artif. Intell.
- ICPR (2)
- CVPR
- Multim. Tools Appl.
- J. Electronic Imaging
- DIAL
- SMC
- WACV
- Appl. Math. Comput.
- IEEE Trans. Instrum. Meas.
- MVA
- IGARSS
- HIP@ICDAR
- ICWE
- Sensors
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