A unified aging model of NBTI and HCI degradation towards lifetime reliability management for nanoscale MOSFET circuits.
Yao WangSorin CotofanaLiang FangPublished in: NANOARCH (2011)
Keyphrases
- unified model
- high level
- formal model
- mathematical model
- prior knowledge
- probabilistic model
- management system
- em algorithm
- theoretical analysis
- parameter estimation
- process model
- statistical model
- conceptual model
- reliability analysis
- data sets
- prediction model
- knowledge management
- cost function
- objective function
- social networks