Algorithms for simulation of three-dimensional etching.
Kenny K. H. TohAndrew R. NeureutherEdward W. SchecklerPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1994)
Keyphrases
- three dimensional
- orders of magnitude
- data structure
- image sequences
- significant improvement
- learning algorithm
- computational efficiency
- computationally efficient
- computational cost
- simulation model
- artificial neural networks
- computational complexity
- theoretical analysis
- knowledge base
- neural network
- times faster
- graph theory
- simulation environment