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Test Chips With Scan-Based Logic Arrays.
Yu-Hsiang Chen
Chia-Ming Hsu
Kuen-Jong Lee
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2021)
Keyphrases
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built in self test
integrated circuit
data sets
automated reasoning
multi valued
classical logic
computational properties
set theory
chip design