Impact of parasitic elements on CMOS charge pumps: a numerical analysis.

Laura Gobbi Alessandro Cabrini Guido Torelli

Published in: ISCAS (2006)

Keyphrases

numerical analysis
image enhancement
high speed
finite difference
charge coupled devices
low cost
factors that influence
high impact
power consumption
data mining
power supply
genetic algorithm
vlsi circuits
database
digital camera
delay insensitive
charge coupled device