A Diagnosis Algorithm for Constant Degree Structures and Its Application to VLSI Circuit Testing.
Kaiyuan HuangVinod K. AgarwalLaurence E. LaForgeKrishnaiyan ThulasiramanPublished in: IEEE Trans. Parallel Distributed Syst. (1995)
Keyphrases
- theoretical analysis
- objective function
- experimental evaluation
- learning algorithm
- improved algorithm
- classification algorithm
- detection algorithm
- search space
- significant improvement
- high accuracy
- optimization algorithm
- segmentation algorithm
- computational cost
- np hard
- optimal solution
- cost function
- reinforcement learning
- medical diagnosis
- recognition algorithm
- image processing
- computationally efficient
- signal processing
- neural network
- k means
- evolutionary algorithm
- dynamic programming
- fault diagnosis
- tree structure
- matching algorithm
- convergence rate
- simulated annealing
- feature selection