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RF Specification Test Compaction Using Learning Machines.

Haralampos-G. D. StratigopoulosPetros DrineasMustapha SlamaniYiorgos Makris
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2010)
Keyphrases
  • learning machines
  • support vector
  • ensemble learning
  • model selection
  • data mining
  • machine learning
  • pairwise
  • generalization error
  • pattern recognition
  • test data
  • learning problems
  • training algorithm
  • vc dimension