Measurement Method for the Dynamic On-State Resistance of GaN Semiconductors.
Michal SírIvan FenoPublished in: EECS (2018)
Keyphrases
- pairwise
- high accuracy
- synthetic data
- main contribution
- genetic algorithm
- optimization algorithm
- computationally efficient
- detection method
- high precision
- significant improvement
- classification method
- support vector machine
- edge detection
- feature space
- preprocessing
- theoretical analysis
- objective function
- support vector machine svm
- neural network
- gray scale
- evaluation method
- clustering method
- dynamic environments
- input data
- denoising
- experimental evaluation
- optical flow
- artificial neural networks