Automatic Test Program Generation from RT-Level Microprocessor Descriptions.

Fulvio Corno Gianluca Cumani Matteo Sonza Reorda Giovanni Squillero

Published in: ISQED (2002)

Keyphrases

test cases
higher level
semi automatic
statistical significance
real time
information retrieval
high level
fully automatic
machine learning
test data
programming environment
generation process