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Automatic Test Program Generation from RT-Level Microprocessor Descriptions.
Fulvio Corno
Gianluca Cumani
Matteo Sonza Reorda
Giovanni Squillero
Published in:
ISQED (2002)
Keyphrases
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test cases
higher level
semi automatic
statistical significance
real time
information retrieval
high level
fully automatic
machine learning
test data
programming environment
generation process