Silicon Wafer Defect Extraction Based on Morphological Filter and Watershed Algorithm.

Yanyan Huang Fengquan Zhang Ming Yu Yue Zhao

Published in: CSSE (6) (2008)

Keyphrases

morphological filters
watershed algorithm
mathematical morphology
median filter
structuring elements
morphological operators
morphological operations
gray scale
watershed segmentation
image processing
noise reduction
image analysis
edge detection
active contours