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Row-linear feedback shift register-column x-masking technique for simultaneous testing of many-core system chips.
W.-C. Wang
C.-Y. Hsu
James Chien-Mo Li
Y.-C. Sung
A. Rao
L.-T. Wang
Published in:
IET Comput. Digit. Tech. (2011)
Keyphrases
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shift register
high speed
random number generator
hardware implementation
test cases
rows and columns
binary matrix
binary matrices
computer systems
software testing
data matrix
machine learning
image retrieval
computer vision
efficient implementation
user feedback