Classification of Critical Points Using a Second Order Derivative.
Michal SmolikVáclav SkalaPublished in: ICCS (2017)
Keyphrases
- critical points
- pattern recognition
- feature space
- classification accuracy
- pattern classification
- decision trees
- feature extraction
- support vector machine
- classification method
- image classification
- higher order
- feature selection
- training set
- multiscale
- machine learning
- image features
- supervised learning
- scale space
- support vector machine svm
- image segmentation
- image processing
- reference points