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Upcoming Challenges of ESD Reliability in DTCO with BS-PDN Routing via BPRs.
W.-C. Chen
S.-H. Chen
Anabela Veloso
Kateryna Serbulova
Geert Hellings
Guido Groeseneken
Published in:
VLSI Technology and Circuits (2023)
Keyphrases
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lessons learned
network reliability
routing algorithm
open issues
artificial intelligence
key issues
database
ad hoc networks
data sets
databases
machine learning
information retrieval
routing protocol
network topology
network topologies
inter domain