Sign in

High-Resolution Detection of Microwave Fields on Chip Surfaces Based on Scanning Microwave Microscopy.

Tao PeiFan ChengXu Dong JiaZhong Hao LiHao GuoHuan Fei WenYan Jun LiJun TangJun Liu
Published in: IEEE Trans. Instrum. Meas. (2023)
Keyphrases