Automatic post-picking improves particle image detection from Cryo-EM micrographs
Ramin NorousiStephan WicklesThomas BeckerRoland BeckmannVolker J. SchmidAchim TreschPublished in: CoRR (2011)
Keyphrases
- image features
- input image
- image data
- image content
- single image
- template matching
- image representation
- image retrieval
- bounding box
- low level
- image classification
- hough transform
- image matching
- edge detection
- aerial images
- bayesian framework
- high resolution
- image analysis
- multiscale
- image collections
- test images
- feature points
- image regions
- image pixels
- detection method
- image segmentation
- digital images
- pixel values
- detection algorithm
- gaussian mixture
- image structure
- region of interest
- segmentation method
- image database
- object detection
- similarity measure