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Trapping characteristics and parametric shifts in lateral GaN HEMTs with SiO2/AlGaN gate stacks.

M. P. KingJ. R. DickersonS. DasGuptaMatthew J. MarinellaR. J. KaplarDaniel PiedraMin SunTomás Palacios
Published in: IRPS (2015)
Keyphrases
  • silicon dioxide
  • neural network
  • decision making
  • knowledge base
  • decision trees
  • bayesian networks
  • multiresolution
  • computer vision
  • case study
  • data structure