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Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester.

Yoshiyuki NakamuraThomas ClouqueurKewal K. SalujaHideo Fujiwara
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2007)
Keyphrases
  • low memory
  • high speed
  • multiscale
  • feature extraction
  • multiresolution
  • coding scheme