Login / Signup

A 65nm flip-flop array to measure soft error resiliency against high-energy neutron and alpha particles.

Jun FurutaChikara HamanakaKazutoshi KobayashiHidetoshi Onodera
Published in: ASP-DAC (2011)
Keyphrases
  • high energy
  • error measure
  • similarity measure
  • error rate
  • cmos technology
  • flip flops
  • relational databases
  • multi view
  • power consumption