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A 65nm flip-flop array to measure soft error resiliency against high-energy neutron and alpha particles.
Jun Furuta
Chikara Hamanaka
Kazutoshi Kobayashi
Hidetoshi Onodera
Published in:
ASP-DAC (2011)
Keyphrases
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high energy
error measure
similarity measure
error rate
cmos technology
flip flops
relational databases
multi view
power consumption