Testing Product Generation in Software Product Lines Using Pairwise for Features Coverage.

Beatriz Pérez Lamancha Macario Polo Usaola

Published in: ICTSS (2010)

Keyphrases

pairwise
software product line
product line
feature set
test suite
learning methodologies
software engineering
test cases
databases
life cycle
similarity function
feature space
test set
teaching learning
information redundancy