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Pseudo Functional Path Delay Test through Embedded Memories.

Yukun GaoTengteng ZhangPunj PokharelSwati ChakrabortyD. M. H. Walker
Published in: J. Electron. Test. (2015)
Keyphrases
  • machine learning
  • response time
  • databases
  • learning algorithm
  • statistically significant
  • statistical tests
  • destination node