Large margin projection-based multi-metric learning for classification.
Chao YuanLiming YangPublished in: Knowl. Based Syst. (2022)
Keyphrases
- metric learning
- distance metric learning
- nearest neighbor classification
- support vector
- distance metric
- feature space
- machine learning and pattern recognition
- margin maximization
- image classification
- learning tasks
- classification accuracy
- semi supervised
- multi task
- pattern recognition
- fully supervised
- decision trees
- supervised learning
- machine learning
- knn classification
- kernel learning
- text classification
- labeled data
- feature vectors
- machine learning algorithms
- neural network
- feature selection
- similarity search
- dimensionality reduction
- knn
- positive semi definite
- feature extraction
- data mining