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Contact Resistivity in Nonplanar FETs.

N. BreilB.-C. LeeJ. Avila AvendanoJ. JewellM. VellaikalE. NewmanE. M. BaziziA. PalL. LiuOleg GluschenkovA. GreeneS. MochizukiN. LoubetB. ColombeauB. Haran
Published in: VLSI Technology and Circuits (2023)
Keyphrases
  • pattern recognition
  • grain size
  • databases
  • genetic algorithm
  • feature selection
  • image segmentation
  • image analysis
  • x ray
  • electron microscopy
  • room temperature