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In-depth electrical characterization of carrier transport in ambipolar Si-NW Schottky-barrier FETs.

Dae-Young JeonTim BaldaufSo Jeong ParkSebastian PreglLarysa BarabanGianaurelio CunibertiThomas MikolajickWalter M. Weber
Published in: ESSDERC (2017)
Keyphrases
  • schottky barrier
  • depth map
  • depth information
  • neural network
  • field effect transistors
  • data sets
  • genetic algorithm
  • image sequences
  • high quality
  • physical characteristics
  • low voltage
  • defocused images