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Hidden Markov and Independence Models with Patterns for Sequential BIST.

Laurent BréhélinOlivier GascuelGilles CarauxPatrick GirardChristian Landrault
Published in: VTS (2000)
Keyphrases
  • model selection
  • experimental data
  • spatial patterns
  • statistical models
  • database
  • machine learning
  • information systems
  • prior knowledge
  • machine learning algorithms