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Capacity planning for integrated circuit final test plants.

James C. ChenCheng-Ju SunTzu-Li Chen
Published in: Int. J. Comput. Integr. Manuf. (2015)
Keyphrases
  • integrated circuit
  • capacity planning
  • capacity expansion
  • supply chain
  • stochastic programming
  • built in self test
  • supply chain management
  • electron beam
  • image processing
  • context aware