Redundant STT-MTJ-based nonvolatile flip-flops for low write-error-rate operations.

Naoya Onizawa Takahiro Hanyu

Published in: NEWCAS (2016)

Keyphrases

error rate
test set
flip flops
lower error rates
rule sets
equal error rate
multiple input
word error rate
image processing
misclassification rate
write operations
cost sensitive classification
false discovery rate
correct recognition rate