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Application of Sampling in Industrial Analog Defect Simulation.

Mayukh BhattacharyaBeatrice SolignacMichael Dürr
Published in: ITC (2022)
Keyphrases
  • real world
  • information retrieval
  • learning algorithm
  • artificial intelligence
  • decision support
  • simulation study
  • simulation model
  • industrial applications
  • defect detection