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Automated system level functional test program generation on ATE from EDA using Functional Test Abstraction.

Motoo UedaShinichi IshikawaMasaru GoishiSatoru KitagawaHiroshi ArakiShuichi Inage
Published in: ITC (2012)
Keyphrases
  • test cases
  • database
  • databases
  • e learning
  • multiscale
  • test data
  • real time
  • image segmentation
  • high level
  • image sequences
  • logic programs
  • higher level
  • multiple choice